IFM – Infinite Focus Microscopy
The IFM uses the optical technology of Focus Variation to measure an almost unlimited range of surfaces.
Components are traceably measured in high accuracy, with a high vertical resolution and in high repeatability.
The robust measurement principle of Focus-Variation in combination with a vibration-isolating hardware enables the form and roughness measurement of also large and heavy components.
All axes of InfiniteFocus are equipped with highly accurate encoders ensuring precise stage movement.
The IFM uses the optical technology of Focus Variation to measure an almost unlimited range of surfaces.
Components are traceably measured in high accuracy, with a high vertical resolution and in high repeatability.
The robust measurement principle of Focus-Variation in combination with a vibration-isolating hardware enables the form and roughness measurement of also large and heavy components.
All axes of InfiniteFocus are equipped with highly accurate encoders ensuring precise stage movement.
Applications
- Surface and Microanalytics
- 3-D imaging of surface structures and measurement of roughness using the focus variation method
- measurement of profiles
Technical Specifications
Brucker Alicona - InfiniteFocus G4g System
- non-contact, optical, three-dimensional, based on Focus-Variation incl. Vertical Focus Probing technology
- Objective magnification: 2.5x to 100x
- Vertical resolution:2300 to 10nm
Contact
Chemical and Physical Analytics
Mittelstetter Weg 2, 86830 Schwabmünchen