IFM – Infinite Focus Microscopy
Applications
- Surface and Microanalytics
- 3-D imaging of surface structures and measurement of roughness using the focus variation method
- measurement of profiles
Technical Specifications
Brucker Alicona - InfiniteFocus G4g System
- non-contact, optical, three-dimensional, based on Focus-Variation incl. Vertical Focus Probing technology
- Objective magnification: 2.5x to 100x
- Vertical resolution:2300 to 10nm
Contact
Chemical and Physical Analytics
E-Mail: Analytic.SWM@osram.com
Chemical and Physical AnalyticsMittelstetter Weg 2, 86830 Schwabmünchen